COMPOSITE ELEMENTAL STANDARDS FOR QUANTITATIVE ELECTRON MICROSCOPE MICROPROBE ANALYSIS.
- Author
- ROWSE JB; JEPSON WB; BAILEY AT; CLIMPSON NA; SOPER PM
ECLP & CO. LTD., ST AUSTELL, CORNWALL - Source
- J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 7; PP. 512-514; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROSCOPIE ELECTRONIQUE ANALYSE CHIMIQUE ECHANTILLON PREPARATION ETALON MICROSONDE ELECTRONIQUE METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7530050815
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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