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A DEFECT PRODUCED IN LOW POWER ELECTRON MICROGRAPHS BY THIN-FOIL OBJECTIVE APERTURES.

Author
ROSTGAARD J
ANAT. DEP. C UNIV. COPENHAGEN, 2100 COPENHAGEN, DEN.
Source
J. MICR.; G.B.; DA. 1974; VOL. 101; NO 3; PP. 291-297
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE IMAGE QUALITE IMAGE DEFAUT MICROGRAPHIE METROLOGIE PHYSIQUE THEORIQUE CRISTALLOGRAPHIE
Keyword (en)
MEASUREMENT SCIENCE THEORETICAL PHYSICS CRISTALLOGRAPHY
Keyword (es)
METROLOGIA FISICA TEORICA CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7530064433

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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