Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=PASCAL7540021548
A DETERMINATION OF THE ABSOLUTE VALUES AND SIGNS OF THE 111 AND 222 STRUCTURE FACTORS OF SILICON.
- Author
-
ANDO Y; ICHIMIYA A; UYEDA R
DEP. APPL. PHYS., FAC. ENG., NAGOYA UNIV., NAGOYA, JAP. - Source
- ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 4; PP. 600-601; BIBL. 10 REF.
- Document type
-
Article
- Language
- English
- Keyword (fr)
- FACTEUR STRUCTURE SILICIUM THEORIE DYNAMIQUE DIFFRACTION ELECTRON SIGNE AMPLITUDE THEORIE N FAISCEAUX DIFFRACTION BRAGG CRISTALLOGRAPHIE
- Keyword (en)
- CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
-
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
-
Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7540021548
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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