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SOCIETY OF PHOTOGRAPHIC SCIENTISTS AND ENGINEERS. 28TH ANNUAL CONFERENCE AND SEMINAR ON QUALITY CONTROL; DENVER, COLO.; 1975.

Source
WASHINGTON, D.C.; SOC. PHOTOGR. SCI. ENG.; DA. 1975; PP. (244P.); BIBL. DISSEM.
Document type
Book
Language
English
Keyword (fr)
CONTROLE QUALITE CONGRES ETATS UNIS PHOTOGRAPHIE 1975 DENVER RECHERCHE OPERATIONNELLE MATHEMATIQUES APPLIQUEES METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
OPERATIONAL RESEARCH APPLIED MATHEMATICS MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
MATEMATICAS APPLICADAS METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Mathematics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7630065879

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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