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CARACTERISATION DE STABILITE DES ETALONS DE FREQUENCE.

Author
UEBERSFELD J; RUTMAN J
LAB. PHYS. METROL. OSCILLATEURS, C.N.R.S., 25000 BESANCON
Source
IN: ELECTRON. MES. COLLOQ. INT. COMMUN.; PARIS; 1975; PARIS; COM. ORGAN. COLLOQ. INT. ELECTRON. MES.; DA. 1975; PP. 101-110; ABS. ANGL.; BIBL. 10 REF.
Document type
Conference Paper
Language
French
Keyword (fr)
FREQUENCE ETALON STABILITE FREQUENCE OSCILLATEUR ANALYSE STATISTIQUE METROLOGIE METROLOGIE PHYSIQUE THEORIQUE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
MEASUREMENT SCIENCE THEORETICAL PHYSICS ELECTROMAGNETISM ELECTRONICS
Keyword (es)
METROLOGIA FISICA TEORICA ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7630080700

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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