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ELECTRICAL BREAKDOWN IN VERY THIN AL2O3 FILMS.

Author
BARDHAN AR; SRIVASTAVA PC; BHATTACHARYA IB; BHATTACHARYA DL
DEP. PHYS., BANARAS HINDU UNIV., VARANASI 221005, INDIA
Source
INTERNATION. J. ELECTRON.; G.B.; DA. 1975; VOL. 39; NO 3; PP. 343-351; BIBL. 24 REF.
Document type
Article
Language
English
Keyword (fr)
DISRUPTION ELECTRIQUE COUCHE MINCE MATERIAU DIELECTRIQUE STRUCTURE COMPOSEE STRUCTURE MOM COMPOSE ALUMINIUM OXYDE ALUMINE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7630093773

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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