A METHOD FOR DETERMINING THE COEFFICIENT OF SPHERICAL ABERRATION FROM A SINGLE ELECTRON MICROGRAPH.
- Other title
- UNE METHODE POUR DETERMINER LE COEFFICIENT D'ABERRATION SPHERIQUE A PARTIR D'UNE SEULE MICROGRAPHIE ELECTRONIQUE (fr)
- Author
- KRIVANEK OL
CAVENDISH LAB., CAMBRIDGE - Source
- OPTIK; DTSCH.; DA. 1976; VOL. 45; NO 1; PP. 97-101; ABS. ALLEM.; BIBL. 10 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MICROSCOPIE ELECTRONIQUE MICROSCOPE ELECTRONIQUE ABERRATION OPTIQUE ABERRATION SPHERIQUE METROLOGIE PHYSIQUE THEORIQUE
- Keyword (en)
- MEASUREMENT SCIENCE THEORETICAL PHYSICS
- Keyword (es)
- METROLOGIA FISICA TEORICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7630239170
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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