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THERMAL AND FIELD EMISSION EFFECTS OF LASER RADIATION ON METAL WHISKER DIODES: APPLICATION TO INFRARED DETECTION DEVICES.

Author
SULLIVAN TE; CUTLER PH; LUCAS AA
DEP. PHYS., PENNSYLVANIA STATE UNIV., UNIVERSITY PARK, PA. 16802, U.S.A.
Source
SURF. SCI.; NETHERL.; DA. 1976; VOL. 54; NO 3; PP. 561-579; BIBL. 39 REF.
Document type
Article
Language
English
Keyword (fr)
DETECTEUR RAYONNEMENT RAYONNEMENT IR DIODE CONTACT PONCTUEL METAL EMISSION ELECTRONIQUE CHAMP FAISCEAU LASER TEMPERATURE EFFET TUNNEL STRUCTURE MOM IRRADIATION LASER IR SOLIDE ACTION ELECTROMAGNETISME ELECTRONIQUE OPTIQUE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS OPTICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA OPTICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7630275293

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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