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CONTACT RESISTANCE OF METAL-SILICON SYSTEMS AT MICROWAVE FREQUENCIES.

Author
CHIANG YS; DENLINGER EJ; WEN CP
RCA LAB., PRINCETON, N.J. 08540
Source
R.C.A. REV.; U.S.A.; DA. 1976; VOL. 37; NO 1; PP. 107-118; BIBL. 23 REF.
Document type
Article
Language
English
Keyword (fr)
CONTACT ELECTRIQUE CONTACT METAL SEMICONDUCTEUR RESISTANCE CONTACT HYPERFREQUENCE ELECTROMAGNETISME ELECTRONIQUE PHYSIQUE SOLIDE
Keyword (en)
ELECTROMAGNETISM ELECTRONICS SOLID PHYSICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7630295511

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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