ETUDE PAR DIFFRACTION DES RAYONS X, SPECTOMETRIE RAMAN, ELLIPSOMETRIE, DIFFRACTION D'ELECTRONS SOUS INCIDENCE RASANTE, MICROSCOPIE ELECTRONIQUE A BALAYAGE, DU SILICIUM DOPE AU PHOSPHORE PAR IMPLANTATION IONIQUE.
- Author
- BISARO R
LAB. CENTRAL DE RECHERCHES THOMSON-CSF - Source
- S.L.; DA. S.D.; PP. 1-87; H.T. 46; BIBL. 5 P. 1/2; (THESE DOCT. 3E CYCLE, SPEC. CRISTALLALOGR. MENTION SCI. MATER.; PARIS VI)
- Document type
- Thesis
- Language
- French
- Keyword (fr)
- SILICIUM IMPLANTATION IMPURETE AMORPHISATION ANALYSE DIFFRACTION RX SPECTROMETRIE RAMAN ELLIPSOMETRIE ANALYSE DIFFRACTION ELECTRON ANALYSE ME BALAYAGE DOPAGE P CRISTALLOGRAPHIE
- Keyword (en)
- CRISTALLOGRAPHY
- Keyword (es)
- CRISTALOGRAFIA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7640102967
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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Istex access
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Europe PubMed Central access
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