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ETUDE PAR DIFFRACTION DES RAYONS X, SPECTOMETRIE RAMAN, ELLIPSOMETRIE, DIFFRACTION D'ELECTRONS SOUS INCIDENCE RASANTE, MICROSCOPIE ELECTRONIQUE A BALAYAGE, DU SILICIUM DOPE AU PHOSPHORE PAR IMPLANTATION IONIQUE.

Author
BISARO R
LAB. CENTRAL DE RECHERCHES THOMSON-CSF
Source
S.L.; DA. S.D.; PP. 1-87; H.T. 46; BIBL. 5 P. 1/2; (THESE DOCT. 3E CYCLE, SPEC. CRISTALLALOGR. MENTION SCI. MATER.; PARIS VI)
Document type
Thesis
Language
French
Keyword (fr)
SILICIUM IMPLANTATION IMPURETE AMORPHISATION ANALYSE DIFFRACTION RX SPECTROMETRIE RAMAN ELLIPSOMETRIE ANALYSE DIFFRACTION ELECTRON ANALYSE ME BALAYAGE DOPAGE P CRISTALLOGRAPHIE
Keyword (en)
CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7640102967

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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