THERMAL ANALYSES OF SEMICONDUCTOR LASERS. DIAGNOSIS OF DARK LINE DEFECTS.
- Author
- KOBAYASHI T
OSAKA UNIV. - Source
- REV. ELECTR. COMMUNIC. LAB.; JAP.; DA. 1976; VOL. 24; NO 3-4; PP. 199-213; BIBL. 11 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- LASER SEMICONDUCTEUR DETERIORATION TRANSFERT CHALEUR ECHAUFFEMENT HETEROJONCTION DOUBLE RAYONNEMENT IR MESURE OPTIQUE
- Keyword (en)
- SEMICONDUCTOR LASER DETERIORATION HEAT TRANSFER HEATING UP DOUBLE HETEROJUNCTION INFRARED RADIATION MEASUREMENT OPTICS
- Keyword (es)
- OPTICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730007127
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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