CONTACTLESS MEASUREMENT OF SEMICONDUCTOR CONDUCTIVITY BY RADIO FREQUENCY-FREE-CARRIER POWER ABSORPTION.
- Author
- MILLER GL; ROBINSON DAH; WILEY JD
BELL LAB., MURRAY HILL., N.J. - Source
- REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 7; PP. 799-805; BIBL. 11 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONDUCTIVITE ELECTRIQUE MATERIAU SEMICONDUCTEUR MESURE SANS CONTACT ABSORPTION ENERGIE PORTEUR CHARGE APPAREIL MESURE APPAREIL ELECTRONIQUE HAUTE FREQUENCE ELECTROMAGNETISME ELECTRONIQUE
- Keyword (en)
- ELECTRICAL CONDUCTIVITY NON CONTACT MEASUREMENT ENERGY ABSORPTION CHARGE CARRIER MEASURING INSTRUMENT HIGH FREQUENCY ELECTROMAGNETISM ELECTRONICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730066109
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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