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CONTACTLESS MEASUREMENT OF SEMICONDUCTOR CONDUCTIVITY BY RADIO FREQUENCY-FREE-CARRIER POWER ABSORPTION.

Author
MILLER GL; ROBINSON DAH; WILEY JD
BELL LAB., MURRAY HILL., N.J.
Source
REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 7; PP. 799-805; BIBL. 11 REF.
Document type
Article
Language
English
Keyword (fr)
CONDUCTIVITE ELECTRIQUE MATERIAU SEMICONDUCTEUR MESURE SANS CONTACT ABSORPTION ENERGIE PORTEUR CHARGE APPAREIL MESURE APPAREIL ELECTRONIQUE HAUTE FREQUENCE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ELECTRICAL CONDUCTIVITY NON CONTACT MEASUREMENT ENERGY ABSORPTION CHARGE CARRIER MEASURING INSTRUMENT HIGH FREQUENCY ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7730066109

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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