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THE INFLUENCE OF RECOMBINATION BETWEEN HOLES AND REDUCED REDOX IONS ON THE EFFICIENCY OF HOLE INJECTION FROM ELECTROLYTIC CONTACTS INTO ORGANIC INSULATOR CRYSTALS.

Author
WILLIG F; SCHERER G
FRITZ-HABER INST., D-1000 BERLIN 33
Source
Z. NATURFORSCH., A; DTSCH.; DA. 1976; VOL. 31; NO 8; PP. 981-986; BIBL. 8 REF.
Document type
Article
Language
English
Keyword (fr)
INTERFACE CRISTAL ORGANIQUE INJECTION PORTEUR CHARGE RENDEMENT OXYDOREDUCTION INTERFACE DIELECTRIQUE ELECTROLYTE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
INTERFACES CHARGE CARRIER INJECTION YIELD OXIDATION REDUCTION ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7730087951

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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