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A NEW CLASS OF PRECISION MECHANISMS FOR OPTICAL RESEARCH.

Author
HOWLAND B; WEIBEL FW
RES. LAB. ELECTRON., M.I.T., CAMBRIDGE, MASS. 02139
Source
MASSACHUSETTS INST. TECHNOL., R.L.E. PROGR. REP.; U.S.A.; DA. 1976; NO 118; PP. 245-251; BIBL. 3 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE OPTIQUE MICROSCOPE MICROMETRE MECANIQUE PRECISION METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
OPTICAL MICROSCOPY MICROSCOPE MICROMETER PRECISION ENGINEERING MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7730142263

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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