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ELECTRICAL CHARACTERISTICS OF AMORPHOUS SEMICONDUCTOR THIN FILM OF AS-TE-GE-SI SYSTEM.

Author
MIYAZONO T; SHIRAISHI T; KUROSU T; IIDA M
FAC. ENG., TOKAI UNIV.
Source
ELECTR. ENGNG JAP.; U.S.A.; DA. 1976 PARU 1976; VOL. 95; NO 4; PP. 14-19; BIBL. 20 REF.
Document type
Article
Language
English
Keyword (fr)
COUCHE MINCE MATERIAU SEMICONDUCTEUR MATERIAU AMORPHE MATERIAU PROPRIETE ELECTRIQUE ETAT ELECTRONIQUE SURFACE SURFACE ETAT AMORPHE SYSTEME ARSENIC TELLURE GERMANIUN ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
THIN FILM AMORPHOUS MATERIAL MATERIALS ELECTRICAL PROPERTIES SURFACE ELECTRON STATE SURFACE AMORPHOUS STATE ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7730172113

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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