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CONTACTLESS MEASUREMENTS OF CONDUCTIVITY OF METALS AND SEMICONDUCTORS AND OF PLATING THICKNESS OF SHEET CONDUCTORS.

Author
OLSZEWSKI EJ; CORMACK GD
CARLETON UNIV., OTTAWA K1S 5B6, CAN.
Source
I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1976; VOL. 25; NO 3; PP. 186-190; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
MESURE SANS CONTACT MESURE CONDUCTIVITE ELECTRIQUE MATERIAU SEMICONDUCTEUR MATERIAU CONDUCTEUR METAL EPAISSEUR REVETEMENT REFLECTOMETRIE METHODE DOMAINE TEMPS ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
NON CONTACT MEASUREMENT MEASUREMENT ELECTRICAL CONDUCTIVITY CONDUCTING MATERIAL METAL THICKNESS COATINGS REFLECTOMETRY TIME DOMAIN ANALYSIS ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7730205464

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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