CONTACTLESS MEASUREMENTS OF CONDUCTIVITY OF METALS AND SEMICONDUCTORS AND OF PLATING THICKNESS OF SHEET CONDUCTORS.
- Author
- OLSZEWSKI EJ; CORMACK GD
CARLETON UNIV., OTTAWA K1S 5B6, CAN. - Source
- I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1976; VOL. 25; NO 3; PP. 186-190; BIBL. 5 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- MESURE SANS CONTACT MESURE CONDUCTIVITE ELECTRIQUE MATERIAU SEMICONDUCTEUR MATERIAU CONDUCTEUR METAL EPAISSEUR REVETEMENT REFLECTOMETRIE METHODE DOMAINE TEMPS ELECTROMAGNETISME ELECTRONIQUE
- Keyword (en)
- NON CONTACT MEASUREMENT MEASUREMENT ELECTRICAL CONDUCTIVITY CONDUCTING MATERIAL METAL THICKNESS COATINGS REFLECTOMETRY TIME DOMAIN ANALYSIS ELECTROMAGNETISM ELECTRONICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730205464
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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