THERMAL EMISSION FROM DAMAGE NEAR THE INTERFACE OF SCHOTTKY BARRIERS AND ITS INFLUENCE ON THERMALLY STIMULATED AND TRANSCIENT CURRENT EXPERIMENTS.
- Author
- TAYLOR PD; MORGAN DV
DEP. ELECTR. ELECTRON. ENG., UNIV. LEEDS, LEEDS LS2 9JT, YORKS. - Source
- J. PHYS. D; G.B.; DA. 1977; VOL. 10; NO 1; PP. 73-82; BIBL. 10 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONTACT ELECTRIQUE CONTACT METAL SEMICONDUCTEUR BARRIERE SCHOTTKY CONDUCTIVITE ELECTRIQUE CONDUCTION THERMOSTIMULEE DEFAUT CRISTALLIN REGIME TRANSITOIRE PORTEUR CHARGE GENERATION TENSION POLARISATION PHYSIQUE SOLIDE
- Keyword (en)
- ELECTRIC CONTACT SEMICONDUCTOR METAL CONTACT SCHOTTKY BARRIER ELECTRICAL CONDUCTIVITY THERMOSTIMULATED CONDUCTION CRYSTAL DEFECT DEFECTS UNSTEADY FLOW CHARGE CARRIER GENERATION BIAS VOLTAGE SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730273709
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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