MEASUREMENT OF THE FREE-ELECTRON DENSITY AT THE ONSET OF LASER-INDUCED SURFACE DAMAGE.
- Author
- ALYASSINI N; PARKS JH
DEP. PHYS., UNIV. SOUTH. CALIFORNIA, LOS ANGELES, CALIF. 90007 - Source
- J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 2; PP. 629-634; BIBL. 36 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- FAISCEAU LASER IRRADIATION SURFACE SOLIDE DENSITE ELECTRON DETERIORATION VERRE MESURE DIELECTRIQUE SOLIDE MILIEU TRANSPARENT ACTION OPTIQUE
- Keyword (en)
- LASER BEAM IRRADIATION SURFACE SOLID ELECTRON DENSITY DETERIORATION GLASS MEASUREMENT SOLID DIELECTRIC TRANSPARENT MEDIUM ACTION OPTICS
- Keyword (es)
- OPTICA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730363504
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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