MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS
- Author
- BIELLE DASPET D; PINEL J; BENZOHRA M; GASSET G; MARTY G; BEAUFORT JL
UNIV. PAUL SABATIER, CENT. ETUD. SPAT. RAYONNEM., B.P. 4346, 31029 TOULOUSE CEDEX - Source
- DGRST-7371361; FR.; DA. 1975; PP. (23P.); H.T. 1; BIBL. 2 REF.; (RAPP. FINAL, ACTION CONCERTEE: COMPOSANTS CIRCUITS MICROMINIATURISES)
- Document type
- Report
- Language
- French
- Keyword (fr)
- DIODE DIODE COMMUTATION SILICIUM TRANSISTOR BASE TRANSISTOR METHODE MESURE TRANSISTOR PUISSANCE REGIME INJECTION FORTE DUREE VIE PORTEUR CHARGE REGIME TRANSITOIRE DETECTEUR RAYONNEMENT DISPOSITIF PHOTOELECTRIQUE CELLULE SOLAIRE PORTEUR MINORITAIRE PHOTOCOURANT ELECTROMAGNETISME ELECTRONIQUE
- Keyword (en)
- DIODE SWITCHING DIODE SILICON TRANSISTOR TRANSISTOR BASE MEASUREMENT METHOD POWER TRANSISTOR LIFETIME CHARGE CARRIER UNSTEADY FLOW RADIATION DETECTOR PHOTOELECTRIC CELL SOLAR CELL MINORITY CARRIER ELECTROMAGNETISM ELECTRONICS
- Keyword (es)
- ELECTROMAGNETISMO ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7730380169
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Install on your browser
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:6:\"report\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:0:\"\";s:9:\"\u0000*\u0000jtitle\";s:0:\"\";s:9:\"\u0000*\u0000stitle\";s:0:\"\";s:7:\"\u0000*\u0000date\";s:4:\"1975\";s:9:\"\u0000*\u0000volume\";s:0:\"\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:0:\"\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"BIELLE\";s:10:\"\u0000*\u0000aufirst\";s:6:\"DASPET\";s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:5:{i:0;s:7:\"PINEL J\";i:1;s:10:\"BENZOHRA M\";i:2;s:8:\"GASSET G\";i:3;s:7:\"MARTY G\";i:4;s:11:\"BEAUFORT JL\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:6:\"report\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000title\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000place\";s:0:\"\";s:6:\"\u0000*\u0000pub\";s:0:\"\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:6:\"report\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:0:\"\";s:9:\"\u0000*\u0000jtitle\";s:0:\"\";s:9:\"\u0000*\u0000stitle\";s:0:\"\";s:7:\"\u0000*\u0000date\";s:4:\"1975\";s:9:\"\u0000*\u0000volume\";s:0:\"\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:0:\"\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"BIELLE\";s:10:\"\u0000*\u0000aufirst\";s:6:\"DASPET\";s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:5:{i:0;s:7:\"PINEL J\";i:1;s:10:\"BENZOHRA M\";i:2;s:8:\"GASSET G\";i:3;s:7:\"MARTY G\";i:4;s:11:\"BEAUFORT JL\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:6:\"report\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000title\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000place\";s:0:\"\";s:6:\"\u0000*\u0000pub\";s:0:\"\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:6:\"report\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:0:\"\";s:9:\"\u0000*\u0000jtitle\";s:0:\"\";s:9:\"\u0000*\u0000stitle\";s:0:\"\";s:7:\"\u0000*\u0000date\";s:4:\"1975\";s:9:\"\u0000*\u0000volume\";s:0:\"\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:0:\"\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"BIELLE\";s:10:\"\u0000*\u0000aufirst\";s:6:\"DASPET\";s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:5:{i:0;s:7:\"PINEL J\";i:1;s:10:\"BENZOHRA M\";i:2;s:8:\"GASSET G\";i:3;s:7:\"MARTY G\";i:4;s:11:\"BEAUFORT JL\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:6:\"report\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000title\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000place\";s:0:\"\";s:6:\"\u0000*\u0000pub\";s:0:\"\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:6:\"report\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:0:\"\";s:9:\"\u0000*\u0000jtitle\";s:0:\"\";s:9:\"\u0000*\u0000stitle\";s:0:\"\";s:7:\"\u0000*\u0000date\";s:4:\"1975\";s:9:\"\u0000*\u0000volume\";s:0:\"\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:0:\"\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"BIELLE\";s:10:\"\u0000*\u0000aufirst\";s:6:\"DASPET\";s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:5:{i:0;s:7:\"PINEL J\";i:1;s:10:\"BENZOHRA M\";i:2;s:8:\"GASSET G\";i:3;s:7:\"MARTY G\";i:4;s:11:\"BEAUFORT JL\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:6:\"report\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000title\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000place\";s:0:\"\";s:6:\"\u0000*\u0000pub\";s:0:\"\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:6:\"report\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:0:\"\";s:9:\"\u0000*\u0000jtitle\";s:0:\"\";s:9:\"\u0000*\u0000stitle\";s:0:\"\";s:7:\"\u0000*\u0000date\";s:4:\"1975\";s:9:\"\u0000*\u0000volume\";s:0:\"\";s:8:\"\u0000*\u0000issue\";s:0:\"\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:0:\"\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"BIELLE\";s:10:\"\u0000*\u0000aufirst\";s:6:\"DASPET\";s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";a:5:{i:0;s:7:\"PINEL J\";i:1;s:10:\"BENZOHRA M\";i:2;s:8:\"GASSET G\";i:3;s:7:\"MARTY G\";i:4;s:11:\"BEAUFORT JL\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:6:\"report\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000title\";s:121:\"MISE AU POINT D'UNE METHODE DE MESURE DU TEMPS DE VIE DANS LA BASE DE DIODES RAPIDES OU DE COMMUTATION ET LES TRANSISTORS\";s:8:\"\u0000*\u0000place\";s:0:\"\";s:6:\"\u0000*\u0000pub\";s:0:\"\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
