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DER EINFLUSS DER RAUHIGKEIT DER PROBENOBERFLAECHE AUF DIE ERGEBNISSE ELLIPSOMETRISCHER MESSUNGEN BEI GAAS.

Other title
INFLUENCE DE LA RUGOSITE DE LA SURFACE SUR LES RESULTATS DE MESURES ELLIPSOMETRIQUES SUR GAAS (fr)
Author
LOSCHKE K; KUHN G
SEKT. CHEM., KARL-MARX-UNIV., DDR-703 LEIPZIG
Source
KRISTALL U. TECH.; DTSCH.; DA. 1976; VOL. 11; NO 6; PP. 645-652; ABS. ANGL.; BIBL. 18 REF.
Document type
Article
Language
German
Keyword (fr)
ELLIPSOMETRIE MICROSTRUCTURE EPAISSEUR SURFACE RUGOSITE GALLIUM COMPOSE ARSENIURE COUCHE MINCE GALLIUM ARSENIURE COMPOSE MINERAL INDICE REFRACTION METHODE MESURE ARSENIURE GALLIUM CRISTALLOGRAPHIE PHYSIQUE SOLIDE
Keyword (en)
ELLIPSOMETRY MICROSTRUCTURE ULTRASTRUCTURE THICKNESS SURFACE ROUGHNESS GALLIUM COMPOUND ARSENIDES THIN FILM INORGANIC COMPOUND REFRACTIVE INDEX MEASUREMENT METHOD CRISTALLOGRAPHY SOLID PHYSICS
Keyword (es)
CRISTALOGRAFIA FISICA DEL ESTADO CONDENSADO
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7740085852

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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