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A TANDEM MASS SPECTROMETER AND ENERGY ANALYZER FOR NEGATIVE SURFACE IONIZATION STUDIES-DETERMINATION OF ELECTRON AFFINITIES.

Author
BLAIS JC; BRUNOT A; COTTIN M
LAB. CURIE, 75231 PARIS CEDEX 05, FR.
Source
INTERNATION. J. MASS. SPECTROM. ION PHYS.; NETHERL.; DA. 1976; VOL. 22; NO 1-2; PP. 71-83; BIBL. 23 REF.
Document type
Article
Language
English
Keyword (fr)
ATOME AFFINITE ELECTRONIQUE IONISATION SPECTROMETRIE MASSE METHODE ETUDE APPAREILLAGE IONISATION SURFACE SPECTROMETRIE PARTICULE CHARGEE SPECTROMETRIE TANDEM PHYSIQUE MOLECULAIRE PHYSIQUE ATOMIQUE ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
ATOMS ELECTRON AFFINITY IONIZATION MASS SPECTROMETRY MASS SPECTROSCOPY INVESTIGATION METHOD SURFACE IONIZATION CHARGED PARTICLE SPECTROMETRY MOLECULAR PHYSICS ATOMIC PHYSICS ELECTROMAGNETISM ELECTRONICS
Keyword (es)
FISICA MOLECULAR FISICA ATOMICA ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Atomic and molecular physics Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7740229701

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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