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OFF-AXIS CHANNELING DISORDER ANALYSIS.

Author
FOTI G; BAERI P; RIMINI E; CAMPISANO SU
IST. STRUTT. MATER., UNIV. CATANIA, 57-195129 CATANIA, ITALY
Source
J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 12; PP. 5206-5213; BIBL. 26 REF.
Document type
Article
Language
English
Keyword (fr)
SILICIUM IMPLANTATION IMPURETE IRRADIATION ION DEFAUT IRRADIATION DECANALISATION PARTICULE CANALISATION PARTICULE ETUDE EXPERIMENTALE METHODE ETUDE METALLOIDE DOPAGE N CRISTALLOGRAPHIE
Keyword (en)
SILICON ION IRRADIATION IRRADIATION DEFECT PARTICLE DECHANNELING EXPERIMENTAL STUDY INVESTIGATION METHOD CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7740271731

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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