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SPEKTROCHEMISCHE BESTIMMUNG VON SILIZIUM IN ALXGA1-XAS UND PHYSIKALISCHE EIGENSCHAFTEN DER KRISTALLE.

Other title
DETERMINATION SPECTROMETRIQUE DU SILICIUM DANS ALXGA1-XAS ET PROPRIETES PHYSIQUES DES CRISTAUX (fr)
Author
FISCHER L; KUHN G; BINDEMANN R; NEUMANN H
SEKT. CHEM., KARL-MARX-UNIV. LEIPZIG, DDR-701 LEIPZIG
Source
KRISTALL U. TECH.; DTSCH.; DA. 1977; VOL. 12; NO 1; PP. 93-100; ABS. ANGL.; BIBL. 10 REF.
Document type
Article
Language
German
Keyword (fr)
SILICIUM DOSAGE SPECTROMETRIE EMISSION ETAT CRISTALLIN ARSENIURE MIXTE ANALYSE QUANTITATIVE PROPRIETE PHYSIQUE COMPOSE DOPE ELEMENT TRACE CHIMIE ANALYTIQUE
Keyword (en)
SILICON ANALYTICAL DETERMINATION EMISSION SPECTROMETRY EMISSION SPECTROSCOPY CRYSTALLINE STATE QUANTITATIVE ANALYSIS PHYSICAL PROPERTIES DOPED COMPOUND TRACE ELEMENT ANALYTICAL CHEMISTRY
Keyword (es)
QUIMICA ANALYTICA
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7760436696

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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