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AN ENERGY FILTER FOR HIGH VOLTAGE ELECTRON MICROSCOPY.

Author
ZANCHI G; SEVELY J; JOUFFREY B
LAB. OPT. ELECTRON., C.N.R.S., 31055 TOULOUSE CEDEX, FR.
Source
J. MICR. SPECTROSC. ELECTRON.; FR.; DA. 1977; VOL. 2; NO 2; PP. 95-104; H.T. 3; BIBL. 15 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE MICROSCOPE HAUTE TENSION FILTRE ENERGIE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ELECTRON MICROSCOPY HIGH VOLTAGE ELECTRON MICROSCOPE MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830023141

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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