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EDGE EFFECT IN BEAM MONITORS.

Author
CUPERUS JH
CERN, 1211 GENEVA 23, SWITZ.
Source
NUCL. INSTRUM. METHODS; NETHERL.; DA. 1977; VOL. 145; NO 2; PP. 233-243; BIBL. 6 REF.
Document type
Article
Language
English
Keyword (fr)
FAISCEAU PARTICULE CHARGEE MONITEUR FAISCEAU EFFET BORD CHAMP FUITE METHODE CALCUL CYLINDRE SECTION RECTANGULAIRE CONDUITE RECTANGULAIRE ELECTRONIQUE
Keyword (en)
CHARGED PARTICLE BEAM BEAM MONITOR EDGE EFFECT LEAKAGE FLUX CALCULATING METHOD RECTANGULAR CROSS SECTION RECTANGULAR PIPE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830045131

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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