A REVIEW OF THE TECHNIQUES USED TO DETERMINE TRAP PARAMETERS IN THE MNOS STRUCTURE.
- Author
- MAR HA; SIMMONS JG
DEP. ELECTR. ENG., UNIV. TORONTO, TORONTO, ONT., CAN. - Source
- I.E.E.E. TRANS-ELECTRON DEVICES; U.S.A.; DA. 1977; VOL. 24; NO 5; PP. 541-546; BIBL. 14 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- STRUCTURE COMPOSEE STRUCTURE MNOS PIEGEAGE PORTEUR CHARGE PORTEUR CHARGE RELAXATION DIELECTRIQUE ELECTRONIQUE
- Keyword (en)
- COMPOUNDED STRUCTURE MNOS STRUCTURE CHARGE CARRIER TRAPPING CHARGE CARRIER DIELECTRIC RELAXATION ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830103533
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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