COMPARISON OF METHODS FOR SENSITIVITY DETERMINATION OF POINT-CONTACT DIODES AT SUBMILLIMETER WAVELENGTH.
- Author
- SAUTER E; SCHULTZ GV
MAX-PLANCK-INST. RADIOASTRON., 53 BONN, GER. - Source
- I.E.E.E. TRANS. MICROWAVE THEORY TECH.; U.S.A.; DA. 1977; VOL. 25; NO 6; PP. 468-470; BIBL. 6 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- DIODE DIODE CONTACT PONCTUEL HYPERFREQUENCE DETECTEUR RAYONNEMENT SENSIBILITE METHODE MESURE ELECTRONIQUE
- Keyword (en)
- DIODE POINT CONTACT DIODE MICROWAVE RADIATION DETECTOR SENSITIVITY MEASUREMENT METHOD ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830122224
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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