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APPLICATION OF NEW METHODS AND TECHNIQUES FOR FAILURE ANALYSIS.

Source
SOLID STATE TECHNOL.; U.S.A.; DA. 1977; VOL. 20; NO 12; PP. 64
Document type
Article
Language
English
Keyword (fr)
DEFAILLANCE FIABILITE ELECTRONIQUE
Keyword (en)
FAILURES RELIABILITY ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830188543

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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