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PRECISE RELATIVE GAMMA -RAY INTENSITIES FOR CALIBRATION OF GE SEMICONDUCTOR DETECTORS.

Author
GEHRKE RJ; HELMER RG; GREENWOOD RC
EG & G IDAHO INC., IDAHO FALLS, IDAHO, USA
Source
NUCL. INSTRUM. METHODS; NETHERL.; DA. 1977; VOL. 147; NO 2; PP. 405-423; BIBL. 65 REF.
Document type
Article
Language
English
Keyword (fr)
DETECTEUR PARTICULE DETECTEUR SEMICONDUCTEUR GERMANIUM COMPENSATION LITHIUM RENDEMENT ETALONNAGE RADIOISOTOPE EMISSION RX SPECTROMETRIE RX ELECTRONIQUE
Keyword (en)
PARTICLE DETECTOR SEMICONDUCTOR DETECTOR GERMANIUM YIELD CALIBRATION RADIOISOTOPE X RAY EMISSION X RAY SPECTROMETRY X-RAY SPECTROSCOPY ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830192653

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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