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POWER TRANSISTOR CRYSTAL DAMAGE IN INDUCTIVE LOAD SWITCHING.

Author
GAUR SP; LOWE G
INTERNATIONAL BUSINESS MACHINES CORP., HOPEWELL JUNCTION, N.Y. 12533, U.S.A.
Source
SOLID-STATE ELECTRON.; G.B.; DA. 1977; VOL. 20; NO 12; PP. 1026-1027; BIBL. 5 REF.
Document type
Article
Language
English
Keyword (fr)
TRANSISTOR TRANSISTOR PUISSANCE CRISTAL DETERIORATION COMMUTATION CHARGE CIRCUIT CHARGE INDUCTIVE ELECTRONIQUE
Keyword (en)
TRANSISTOR POWER TRANSISTOR CRYSTALS DETERIORATION SWITCHING CIRCUIT LOAD INDUCTIVE LOAD ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830198784

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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