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A DETECTION METHOD FOR PRODUCING PHASE AND AMPLITUDE IMAGES SIMULTANEOUSLY IN A SCANNING TRANSMISSION ELECTRON MICROSCOPE.

Author
DEKKERS NH; DE LANG H
PHILIPS RES. LAB., EINDHOVEN
Source
PHILIPS TECH. REV.; NETHERL.; DA. 1977; VOL. 37; NO 1; PP. 1-9; BIBL. 16 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE MICROSCOPE TRANSMISSION FORMATION IMAGE ELECTRONIQUE
Keyword (en)
ELECTRON MICROSCOPY SCANNING MICROSCOPE TRANSMISSION MICROSCOPE IMAGING ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830206982

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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