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THE EFFECT OF CORRELATED DEFECTIVE INSPECTION SCHEME FOR PROCESS CONTROL.

Author
HUANG JS; YANG MCK
DEP. APPL. MATH., N.C.T.U.
Source
J. NATION. CHIAS TUNG UNIV.; TAIWAN; DA. 1977-09; VOL. 3; PP. 67-75; BIBL. 10 REF.
Document type
Article
Language
English
Keyword (fr)
COMMANDE PROCESSUS SYSTEME PRODUCTION DETECTION DEFAUT PROCESSUS MARKOV OPTIMISATION AUTOMATIQUE MATHEMATIQUES APPLIQUEES
Keyword (en)
PROCESS CONTROL PRODUCTION SYSTEM DEFECT DETECTION MARKOV PROCESS OPTIMIZATION CONTROL THEORY APPLIED MATHEMATICS
Keyword (es)
AUTOMATICA MATEMATICAS APPLICADAS
Classification
Pascal
001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics

Discipline
Mathematics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830270063

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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