THE EFFECT OF CORRELATED DEFECTIVE INSPECTION SCHEME FOR PROCESS CONTROL.
- Author
- HUANG JS; YANG MCK
DEP. APPL. MATH., N.C.T.U. - Source
- J. NATION. CHIAS TUNG UNIV.; TAIWAN; DA. 1977-09; VOL. 3; PP. 67-75; BIBL. 10 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- COMMANDE PROCESSUS SYSTEME PRODUCTION DETECTION DEFAUT PROCESSUS MARKOV OPTIMISATION AUTOMATIQUE MATHEMATIQUES APPLIQUEES
- Keyword (en)
- PROCESS CONTROL PRODUCTION SYSTEM DEFECT DETECTION MARKOV PROCESS OPTIMIZATION CONTROL THEORY APPLIED MATHEMATICS
- Keyword (es)
- AUTOMATICA MATEMATICAS APPLICADAS
- Classification
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics
- Discipline
- Mathematics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830270063
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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