DETERMINATION OF THE KONDO SCATTERING AMPLITUDE AND COHERENCE DISTANCE FROM TUNNELING IN DOPED-ELECTRODE JUNCTIONS.
- Author
- BERMON S; SO CK
CITY COLL., CITY UNIV. NEW YORK, NEW YORK, N.Y. 10031 - Source
- PHYS. REV. LETTERS; U.S.A.; DA. 1978; VOL. 40; NO 1; PP. 53-56; BIBL. 7 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- STRUCTURE MIM EFFET TUNNEL TRES BASSE TEMPERATURE IMPURETE EFFET KONDO STRUCTURE COMPOSEE PHYSIQUE SOLIDE
- Keyword (en)
- MIM STRUCTURE TUNNEL EFFECT VERY LOW TEMPERATURE IMPURITIES KONDO EFFECT COMPOUNDED STRUCTURE SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830297838
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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