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CONSTRUCTION OF IMAGE PROCESSING SYSTEMS AND APPLICATION TO THE RANDOM NOISE REMOVAL IN ELECTRON MICROGRAPHS.

Author
TSUJI M; ISODA S; OHARA M; KATAYAMA K; KOBAYASHI K
INST. CHEM. RES., KYOTO UNIV., UJI, KYOTO
Source
BULL. INST. CHEM. RES., KYOTO UNIV.; JAP.; DA. 1977; VOL. 55; NO 2; PP. 237-247; BIBL. 14 REF.
Document type
Article
Language
English
Keyword (fr)
MICROSCOPIE ELECTRONIQUE TRAITEMENT IMAGE FILTRAGE FREQUENCE SPATIALE RAPPORT SIGNAL BRUIT MICROGRAPHIE ELECTRONIQUE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
ELECTRON MICROSCOPY IMAGE PROCESSING SPATIAL FREQUENCY FILTERING SIGNAL-TO-NOISE RATIO ELECTRON MICROGRAPHY MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830303816

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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