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A TEMPERATURE-CONTROLLED SPECTROMETER FOR THE STUDY OF SURFACE BARRIER DETECTORS.

Author
CHAMBERS ME; HAQUE AKMM
POLYTECH. SOUTH BANK, LONDON SE1 0AA, UK
Source
J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 9; PP. 940-944; BIBL. 7 REF.
Document type
Article
Language
English
Keyword (fr)
DETECTEUR PARTICULE DETECTEUR SEMICONDUCTEUR BARRIERE SURFACE FENETRE DETECTEUR MESURE EPAISSEUR SPECTROMETRE TEMPERATURE ELECTRONIQUE
Keyword (en)
PARTICLE DETECTOR SEMICONDUCTOR DETECTOR SURFACE BARRIER MEASUREMENT THICKNESS SPECTROMETER TEMPERATURE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830315666

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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