THE EFFECT OF ANNEALING TEMPERATURE ON THE CARRIER CONCENTRATION OF HG0.6 CD0.4TE.
- Author
- SCHMIDT JL; STELZER EL
HONEYWELL CORP. RES. CENT., BLOOMINGTON, MINN. 55420 - Source
- J. ELECTRON. MATER.; U.S.A.; DA. 1978; VOL. 7; NO 1; PP. 65-81; BIBL. 10 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- CONCENTRATION PORTEUR CHARGE MOBILITE PORTEUR CHARGE EFFET HALL RECUIT CENTRE DONNEUR COMPOSE METAL TRANSITION TELLURURE CADMIUM MERCURE PHYSIQUE SOLIDE
- Keyword (en)
- CHARGE CARRIER CONCENTRATION CHARGE CARRIER MOBILITY HALL EFFECT ANNEALING DONOR CENTER SOLID PHYSICS
- Keyword (es)
- FISICA DEL ESTADO CONDENSADO
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830337771
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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