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PRECISION ABSOLUTE MEASUREMENTS OF STRONG AND HIGHLY INHOMOGENEOUS MAGNETIC FIELDS.

Author
HONIG A; MOROZ M
PHYS. DEP., SYRACUSE UNIV., SYRACUSE, N.Y. 13210
Source
REV. SCI. INSTRUM.; U.S.A.; DA. 1978; VOL. 49; NO 2; PP. 183-187; BIBL. 14 REF.
Document type
Article
Language
English
Keyword (fr)
CHAMP MAGNETIQUE MESURE ELECTROAIMANT SUPRACONDUCTEUR DISPOSITIF SEMICONDUCTEUR TRANSDUCTEUR PHOTOCONDUCTIVITE FREQUENCE PUISSANCE ELECTRIQUE HYPERFREQUENCE PHOTOCONDUCTIVITE DEPENDANT SPIN SILICIUM ELECTROMAGNETISME ELECTRONIQUE
Keyword (en)
MAGNETIC FIELD MEASUREMENT SUPERCONDUCTING MAGNET SEMICONDUCTOR DEVICE TRANSDUCER PHOTOCONDUCTIVITY FREQUENCY ELECTRIC POWER MICROWAVE SILICON ELECTROMAGNETISM ELECTRONICS
Keyword (es)
ELECTROMAGNETISMO ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830343848

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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