ANALYSE DES KLEINSIGNALVERHALTENS STATISCHER ANODENDOMAENEN IN GUNN-ELEMENTEN.
- Other title
- ANALYSE DU COMPORTEMENT EN REGIME DE FAIBLES SIGNAUX DE DOMAINES STATIQUES ANODIQUES DANS DES DISPOSITIFS A EFFET GUNN (fr)
- Author
- SCHUEFFNY R; ELSCHNER H; GOETZE R; HOFMANN K; BRAEUER K
TECH. UNIV. DRESDEN, DDR-8027 DRESDEN - Source
- Z. ELEKTR. INFORM.-U. ENERGIETECH.; DTSCH.; DA. 1978; VOL. 8; NO 1; PP. 3-13; BIBL. 1 P. 1/2
- Document type
- Article
- Language
- German
- Keyword (fr)
- DISPOSITIF ETAT SOLIDE DISPOSITIF TRANSFERT ELECTRON REGIME SIGNAL FAIBLE DOMAINE CHAMP ELECTRIQUE ANODE ELECTRONIQUE
- Keyword (en)
- SOLID STATE DEVICE TRANSFERRED ELECTRON DEVICE SMALL SIGNAL BEHAVIOR ELECTRIC FIELD DOMAIN ANODE ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830347833
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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