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DETERMINATION OF THE REFRACTAIRE INDEX AND THICKNESS OF A TRANSPARENT FILM ON A TRANSPARENT SUBSTRATE FROM THE ANGLES OF INCIDENCE OF ZERO REFLECTION-INDUCED ELLIPTICITY.

Author
AZZAM RMA; ZAGHLOUL ARM
UNIV. NEBRASKA MED. CENT., OMAHA, NEBR. 68105, USA
Source
OPT. COMMUNIC.; NETHERL.; DA. 1978; VOL. 24; NO 3; PP. 351-354; BIBL. 3 REF.
Document type
Article
Language
English
Keyword (fr)
INDICE REFRACTION EPAISSEUR COUCHE MINCE MATERIAU TRANSPARENT LUMIERE POLARISEE REFRACTOMETRIE ELLIPSOMETRIE METROLOGIE PHYSIQUE THEORIQUE
Keyword (en)
REFRACTIVE INDEX THICKNESS THIN FILM TRANSPARENT MATERIAL POLARIZED LIGHT REFRACTOMETRY ELLIPSOMETRY MEASUREMENT SCIENCE THEORETICAL PHYSICS
Keyword (es)
METROLOGIA FISICA TEORICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7830349988

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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