MEASURING COPPER THICKNESS IN PLATED THREE HOLES.
- Author
- RITTER J; BUSH G
UNIT PROCESS ASSEMBLIES, SYOSSET, N.Y. - Source
- CIRCUITS MANUF.; U.S.A.; DA. 1978; VOL. 18; NO 5; PP. 34-35
- Document type
- Article
- Language
- English
- Keyword (fr)
- CIRCUIT IMPRIME EPAISSEUR CUIVRE MESURE TROU METALLISE RETRODIFFUSION RAYONNEMENT BETA ELECTRONIQUE
- Keyword (en)
- PRINTED CIRCUIT THICKNESS COPPER MEASUREMENT PLATED THROUGH HOLE BACKSCATTERING BETA RAYS ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7830398188
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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