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A DIRECT COMPARISON BETWEEN SEM(EBIC) AND HVEM IMAGES OF CRYSTAL DEFECTS IN SEMICONDUCTORS.

Author
BLUMTRITT H; GLEICHMANN R
INST. FESTKOERPERPHYS. ELEKTRONENMIKROSK., AKAD. WISS. DDR, 402 HALLE/SAALE, GDR
Source
ULTRAMICROSCOPY; NETHERL.; DA. 1977; VOL. 2; NO 4; PP. 405-408; BIBL. 9 REF.
Document type
Article
Language
English
Keyword (fr)
SEMICONDUCTEUR DEFAUT CRISTALLIN MICROSCOPIE ELECTRONIQUE MICROSCOPE BALAYAGE MICROSCOPE TRANSMISSION MICROSCOPE HAUTE TENSION COMPARAISON METHODE ETUDE METALLOIDE COMPOSE MINERAL CRISTALLOGRAPHIE
Keyword (en)
SEMICONDUCTOR MATERIALS CRYSTAL DEFECT DEFECTS ELECTRON MICROSCOPY SCANNING MICROSCOPE TRANSMISSION MICROSCOPE HIGH VOLTAGE ELECTRON MICROSCOPE INVESTIGATION METHOD INORGANIC COMPOUND CRISTALLOGRAPHY
Keyword (es)
CRISTALOGRAFIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7840188628

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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