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CARACTERISATION DES DEFAUTS CRISTALLINS DES COMPOSES III-V PAR MICROSCOPIE ELECTRONIQUE EN TRANSMISSION ET CORRELATION AVEC CERTAINS MECANISMES DE DEGRADATION DE STRUCTURES ELECTROLUMINESCENTES.

Author
LEBAILLY J; DUPUY M
LA RADIOTECHNIQUE COMPELEC, CAEN
Source
DGRST-7571482; FR.; DA. 1978; PP. 1-15; H.T. 21; (RAPP. FINAL, ACTION CONCERTEE: PHYS. ELECTRON.)
Document type
Report
Language
French
Keyword (fr)
SUPPORT COUCHE EPITAXIQUE HOMOEPITAXIE HETEROEPITAXIE COMPOSE III-V ETUDE EXPERIMENTALE ANALYSE MET DIFFUSION CHIMIQUE DISLOCATION DEFAUT ETENDU PRECIPITE GALLIUM COMPOSE PHOSPHURE ARSENIURE ALUMINIUM COMPOSE COUCHE MULTIPLE HETEROJONCTION GALLIUM PHOSPHURE GALLIUM PHOSPHOARSENIURE GALLIUM ARSENIURE ALUMINIUM GALLIUM ARSENIURE MIXTE SUPPORT GAP COMPOSE MINERAL SUPPORT GAAS DIODE DIODE ELECTROLUMINESCENTE DEFAUT CRISTALLIN COMPOSE BIIIBV DETERIORATION CRISTALLOGRAPHIE ELECTRONIQUE
Keyword (en)
EPITAXIAL FILM HOMOEPITAXY HETEROEPITAXY III-V COMPOUND EXPERIMENTAL STUDY CHEMICAL DIFFUSION DISLOCATION EXTENDED DEFECT PRECIPITATE GALLIUM COMPOUND PHOSPHIDES ARSENIDES ALUMINIUM COMPOUND MULTIPLE LAYER HETEROJUNCTION GALLIUM PHOSPHIDE INORGANIC COMPOUND DIODE LIGHT EMITTING DIODE CRYSTAL DEFECT DEFECTS DETERIORATION CRISTALLOGRAPHY ELECTRONICS
Keyword (es)
CRISTALOGRAFIA ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7840339883

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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