DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY REAGENTS BY MERCURY THIN-FILM ANODIC-STRIPPING VOLTAMMETRY.
- Author
- ISRAEL Y; OFIR T; REZEK J
INST. RES. DEV., HAIFA, ISR. - Source
- MIKROCHIM. ACTA; AUTR.; DA. 1978; NO 1-2; PP. 151-163; ABS. ALLEM.; BIBL. 10 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- VOLTAMMETRIE REDISSOLUTION ANODIQUE APPAREILLAGE ELECTRODE COUCHE MINCE ELEMENT TRACE DOSAGE ENRICHISSEMENT CHIMIQUE ELECTROLYSE ANALYSE CHIMIQUE ZINC CADMIUM THALLIUM PLOMB ANTIMOINE CUIVRE MERCURE CHIMIE ANALYTIQUE
- Keyword (en)
- ANODIC STRIPPING VOLTAMMETRY THIN LAYER ELECTRODE TRACE ELEMENT ANALYTICAL DETERMINATION CHEMICAL ENRICHMENT ELECTROLYSIS CHEMICAL ANALYSIS CHEMICAL COMPOSITION ZINC CADMIUM THALLIUM LEAD ANTIMONY COPPER MERCURY ANALYTICAL CHEMISTRY
- Keyword (es)
- QUIMICA ANALYTICA
- Classification
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7860249306
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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