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ELECTRICAL AND STRUCTURAL PROPERTIES OF ION BEAM SPUTTERED SILVER-SIO2 CERMET FILMS

Author
REINHARDT P; REINHARDT C; REISSE G; WEISSMANTEL C
TECH. HOCHSCH. SEKTION PHYS. ELEKTRON. BAUELEMENTE, KARL-MARX-STADT, DEU
Source
THIN SOLID FILMS; NLD; DA. 1978; VOL. 51; NO 1; PP. 99-104; BIBL. 7 REF.
Document type
Article
Language
English
Keyword (fr)
ARGENT 50-100 COUCHE MINCE CERMET CONDUCTIVITE ELECTRIQUE MICROSTRUCTURE OXYDE DE SILICIUM MICROSCOPIE ELECTRONIQUE EFFET DE LA COMPOSITION ETUDE EXPERIMENTALE STRUCTURE ILOT DEPOT PAR BOMBARDEMENT IONIQUE METALLURGIE
Keyword (en)
THIN FILM CERMET ELECTRICAL CONDUCTIVITY MICROSTRUCTURE ULTRASTRUCTURE ELECTRON MICROSCOPY EXPERIMENTAL STUDY ISLAND STRUCTURE METALLURGY
Keyword (es)
METALURGIA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7900192499

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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