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CONTACT NOISE IN THICK FILM RESISTORS

Author
RHEE JG; CHEN TM
UNIV. SOUTH FLORIDA DEP. ELECTR. ELECTRON. SYSTEMS, TAMPA FL, USA
Source
SOLID STATE TECHNOL.; USA; DA. 1978; VOL. 21; NO 9; PP. 59-62; BIBL. 8 REF.
Document type
Article
Language
English
Keyword (fr)
RESISTANCE ELECTRIQUE RESISTANCE COUCHE EPAISSE BRUIT FOND CONTACT ELECTRIQUE CONFIGURATION GEOMETRIQUE DISTRIBUTION COURANT MESURE BRUIT BASSE FREQUENCE ELECTRONIQUE
Keyword (en)
RESISTOR THICK FILM RESISTOR NOISE ELECTRIC CONTACT GEOMETRICAL CONFIGURATION CURRENT DISTRIBUTION MEASUREMENT 1/F NOISE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930087162

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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