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PRACTICAL APPLICATIONS OF ACCELERATED TESTING OF ELECTRONIC DEVICES

Author
JOWETT CE
Source
MICROELECTRONICS; GBR; DA. 1978; VOL. 9; NO 2; PP. 19-23
Document type
Article
Language
English
Keyword (fr)
ESSAI ESSAI ACCELERE COMPOSANT ELECTRONIQUE TAUX PANNE ELECTRONIQUE
Keyword (en)
TEST ACCELERATED TEST ELECTRONIC COMPONENT FAILURE RATE ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930113758

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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