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A DEVICE FOR MEASURING ELECTRON MICROSCOPE FILAMENTS

Author
SMITH W; GRAY EW; WATSON DG
MOREDUN RES. INST., EDINBURGH SCOTLAND EH 177 JH, GBR
Source
MICRON; GBR; DA. 1978; VOL. 9; NO 3; PP. 161
Document type
Article
Language
English
Keyword (fr)
MICROMETRE LONGUEUR DIMENSION MESURE MICROSCOPE MICROSCOPIE ELECTRONIQUE FILAMENT PHYSIQUE THEORIQUE METROLOGIE
Keyword (en)
MICROMETER LENGTH DIMENSIONS MEASUREMENT MICROSCOPE ELECTRON MICROSCOPY FILAMENT THEORETICAL PHYSICS MEASUREMENT SCIENCE
Keyword (es)
FISICA TEORICA METROLOGIA
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Discipline
Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930132545

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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