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A DIGITALLY CONTROLLED SCANNING MICROPROBE FOR PROTONS AND HEAVY IONS

Author
BONANI G; SUTER M; JUNG H; STOLLER C; WOLFI W
EIDG. TECH. HOCHSCH. LAB. KERNPHYS., ZURICH 8093, CHE
Source
NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 157; NO 1; PP. 55-63; BIBL. 13 REF.
Document type
Article
Language
English
Keyword (fr)
ACCELERATEUR PARTICULE ACCELERATEUR TANDEM OPTIQUE ELECTRONIQUE BALAYAGE MICROANALYSE RX MICROSONDE PROTON ION LOURD ELECTRONIQUE
Keyword (en)
PARTICLE ACCELERATOR TANDEM ACCELERATOR ELECTRON OPTICS SCANNING MICROPROBE PROTONS HEAVY ION ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930193166

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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