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DECIPHER THE MYSTERY OF RELIABILITY STATISTICS

Author
HEWITT BS; BENEDEK M
RAYTHEON CO., WALTHAM MA 02154, USA
Source
MICROWAVES; USA; DA. 1978; VOL. 17; NO 11; PP. 60-64; (4 P.); BIBL. 11 REF.
Document type
Article
Language
English
Keyword (fr)
FIABILITE TRANSISTOR EFFET CHAMP MOYENNE TEMPS BON FONCTIONNEMENT DETERIORATION ELECTRONIQUE
Keyword (en)
RELIABILITY FIELD EFFECT TRANSISTOR MEAN TIME BETWEEN FAILURES DETERIORATION ELECTRONICS
Keyword (es)
ELECTRONICA
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
PASCAL7930297425

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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