AN ASSESSMENT OF THE QUALITY OF ANODIC NATIVE OXIDES OF GAAS FOR MOS DEVICES
- Author
- BREEZE PA; HARTNAGEL HL
UNIV. NEWCASTLE UPON TYNE DEP. ELECTRICAL ELECTRONIC ENG., GBR - Source
- THIN SOLID FILMS; NLD; DA. 1979; VOL. 56; NO 1-2; PP. 51-61; BIBL. 34 REF.
- Document type
- Article
- Language
- English
- Keyword (fr)
- STRUCTURE COMPOSEE STRUCTURE MOS ARSENIURE COMPOSE GALLIUM OXYDE CROISSANCE CRISTALLINE COMPOSITION CHIMIQUE QUALITE ARSENIURE GALLIUM ELECTRONIQUE
- Keyword (en)
- COMPOUNDED STRUCTURE MOS STRUCTURE ARSENIDES OXIDES CRYSTAL GROWTH CHEMICAL COMPOSITION QUALITY ELECTRONICS
- Keyword (es)
- ELECTRONICA
- Classification
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- PASCAL7930360115
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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